Atomic Force Microscopy (AFM) is being used to produce high-resolution images of protein structures. The image resolution of this technique is limited by the physical size of the AFM tip being used.

The image resolution can be improved by implementing a technique called “AFM Localization” where multiple images are aligned and overlapped to produce a clearer picture.

We will implement a version of “AFM Localization” using automated feature recognition and image alignment to enable registration and precise overlap of multiple AFM images for input into an existing localization AFM ImageJ algorithm.